5.1.1 General

38.8843GPPRelease 17Study on enhanced test methods for Frequency Range 2 (FR2) User Equipment (UE)TS

The investigation of high DL power and low UL power enhancements to the FR2 test methodology includes the following aspects: scope of test cases with high DL power and low UL power issues, enhanced test systems, including the investigation of non-permitted systems, enhancements to permitted methods, manufacturer declarations, beam management sensitivity of the DUT in near-field test system environments, and path loss comparison across system types.

Table 5.1.1-1 below provides a summary of the test cases and testability issues.

Table 5.1.1-1: Summary of test cases and testability issues

Clause

Requirement

Testability issue

Test Metric

6.3.1

Minimum output power

Low UL power

EIRP (Link=TX beam peak direction, Meas=Link angle).

6.3.2

Transmit OFF power

Low UL power

TRP (Link=TX beam peak direction, Meas=TRP grid)

6.5.1

Occupied bandwidth

Low UL power

OBW (Link=TX beam peak direction, Meas=Link angle)

6.5.2.3

Adjacent channel leakage ratio

Low UL power

TRP (Link=TX beam peak direction, Meas=TRP grid).

6.5.3.2

Additional spurious emissions

Low UL power

TRP (Link=TX beam peak direction, Meas=TRP grid).

7.4

Maximum input power

High DL power

EIS (Link=RX beam peak direction, Meas=Link angle).

7.5

Adjacent channel selectivity (case 1)

High DL power

EIS (Link=RX beam peak direction, Meas=Link angle)

7.5

Adjacent channel selectivity (case 2)

High DL power

EIS (Link=RX beam peak direction, Meas=Link angle)

7.6.2

In-band blocking

High DL power

EIS (Link=RX beam peak direction, Meas=Link angle)

7.9

Receiver spurious emissions

Low UL power

TRP (Link=TX beam peak direction, Meas=TRP grid).

The investigation of test methodology enhancements to strive to reduce the testability issues which were identified includes study of the feasibility of enhancing test systems which are permitted in TR38.810 [3] as well as test systems which are not permitted. Non-permitted test systems according to TR38.810 [3] are not required to verify all requirements in TS38.101-2 [2]. The candidate test systems are limited to near-field (NF) based solutions and include the following solutions:

– The Direct near-field (DNF) system assumes that all measurements and call setups are performed with a measurement probe in the NF of the DUT.

– The Combined far-field/near-field (CFFNF) system utilizing a transform-based approach assumes that the UE beamlock function (UBF) activation is performed towards the FF beam peak direction based on the far-field method and then test case procedures are performed with measurement probe(s) in the NF of the DUT.

– Combined far-field/direct-near-field (CFFDNF) system assumes that the UE beamlock function (UBF) activation is performed towards the FF beam peak direction based on the far-field method and then test case procedures are performed based on the direct near-field method.

– Combined far-field/delta-near-field (CFFdeltaNF) system utilizing a relative measurement approach assumes that the UE beamlock function (UBF) activation is performed towards the FF beam peak direction based on the far-field method, a reference test case without testability issues is performed both in FF and NF to obtain the relative correction factor, and the final test case procedure are performed in the NF and compensated with the relative correction factor.

The applicability of these NF methodologies is further outlined in Clause 5.1.4.